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    • X-Ray Grazing Incidence Diffraction from Alkylsiloxane Monolayers on Silicon Wafers 

      Tidswell, I. M.; Rabedeau, T. A.; Pershan, Peter S.; Kosowsky, S. D.; Folkers, J. P.; Whitesides, George M. (American Institute of Physics, 1991)
      X‐ray reflection (both specular and off‐specular) and grazing incidence diffraction (GID) have been used to study the structure of alkylsiloxane monolayers (\(n‐C_{18}H_{37}SiO_{1.5}\)) formed by self‐assembly from solution ...