Browsing FAS Scholarly Articles by Keyword "layers"
Now showing items 1-1 of 1
-
X-Ray Grazing Incidence Diffraction from Alkylsiloxane Monolayers on Silicon Wafers
(American Institute of Physics, 1991)X‐ray reflection (both specular and off‐specular) and grazing incidence diffraction (GID) have been used to study the structure of alkylsiloxane monolayers (\(n‐C_{18}H_{37}SiO_{1.5}\)) formed by self‐assembly from solution ...