Terrestrial Measurements of Diffusivities in Refractory Melts by Pulsed Melting of Thin Films

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Terrestrial Measurements of Diffusivities in Refractory Melts by Pulsed Melting of Thin Films

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Title: Terrestrial Measurements of Diffusivities in Refractory Melts by Pulsed Melting of Thin Films
Author: Aziz, Michael; Sanders, Paul G.

Note: Order does not necessarily reflect citation order of authors.

Citation: Sanders, Paul G. and Michael J. Aziz. 2001. In Proceedings of the Microgravity Materials Science Conference 2000, June 6-8, 2000, Huntsville, Alabama, ed. NASA Microgravity Materials Science Conference and Narayanan Ramachandran. Washington, D.C.: NASA.
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Abstract: Laterally homogeneous pulsed melting of thin films is being investigated as a way to eliminate convection and thereby determine diffusivities in refractory mels under terrestrial conditions, providing comparison data for microgravity measurements. The silicon liquid self-diffusivity was determined by pulsed laser melting for 30Si+ experimental concentration spatial profile given the initial concentration profile and the temporal melt-depth profile. The silicon liquid self-diffusivity at the melting point (4.0 plus or minus 0.5) X 10-4cm2/s. Calculations of Buoyancy and Marangoni convection indicate that convective contamination is unlikely.
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Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:2795721

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  • FAS Scholarly Articles [7362]
    Peer reviewed scholarly articles from the Faculty of Arts and Sciences of Harvard University
 
 

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