Modelling a Growth Instability in a Stressed Solid

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Modelling a Growth Instability in a Stressed Solid

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Title: Modelling a Growth Instability in a Stressed Solid
Author: Barvosa-Carter, William; Kaplan, Theodore; Aziz, Michael; Sethian, James A.; Adalsteinsson, David; Gray, Leonard J.; Phan, Anh-Vu

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Citation: Phan, Anh-Vhu, Theodore Kaplan, Leonard J. Gray, David Adalsteinsson, James A. Sethian, William Barvosa-Carter, and Michael J. Aziz. 2001. Modeling a Growth Instability in a Stressed Solid. Modelling and Simulation in Materials Science and Engineering 9(4): 309-325.
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Abstract: The growth of crystalline silicon from the amorphous phase in the presence of an applied stress is modelled using advanced numerical methods. The crystal region is modelled as a linear elastic solid and the amorphous as a viscous fluid with a time-dependent viscosity to reflect structural relaxation. Appropriate coupling conditions across the boundary are defined, and both problems are solved using a symmetric-Galerkin boundary integral method. The interface is advanced in time using the level set technique. The results match well with experiments and support the proposed kinetic mechanism for the observed interface growth instability.
Published Version: http://dx.doi.org/10.1088/0965-0393/9/4/305
Other Sources: www.iop.org/EJ/article/0965-0393/9/4/305/ms1405.pdf
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:2797456

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  • FAS Scholarly Articles [7362]
    Peer reviewed scholarly articles from the Faculty of Arts and Sciences of Harvard University
 
 

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