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dc.contributor.authorBen-Sasson, Eli
dc.contributor.authorSudan, Madhu
dc.contributor.authorVadhan, Salil
dc.contributor.authorWigderson, Avi
dc.date.accessioned2009-05-19T20:32:44Z
dc.date.issued2003
dc.identifier.citationBen-Sasson, Eli, Madhu Sudan, Salil Vadhan, and Avi Wigderson. Randomness-efficient low degree tests and short PCPs via epsilon-biased sets. In Proceedings of the 35th Annual ACM Symposium on the Theory of Computing: San Diego, California, USA, June 9-11, 2003, 612-621. New York, NY: ACM Press.en
dc.identifier.issn0737-8017en
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:2961580
dc.description.abstractWe present the first explicit construction of Probabilistically Checkable Proofs (PCPs) and Locally TestableCodes (LTCs) of fixed constant query complexity which have almost-linear (=n^{1+o(1)}) size. Such objects were recently shown to exist (nonconstructively) by Goldreich and Sudan [2002]. The key to these constructions is a nearly optimal randomness-efficient version of the low degree test [Rubinfeld & Sudan `96]. In a similar way we give a randomness-efficient version of the BLR linearity test [Blum, Luby, Rubinfeld `93] (which is used, for instance, in locally testing the Hadamard code). The derandomizations are obtained through \eps-biased sets for vector spaces over finite fields. The analysis of the derandomized tests rely on alternative views of \eps-biased sets --- as generating sets of Cayley expander graphs for the low-degree test, and as defining linear error-correcting codes for the linearity test.en
dc.description.sponsorshipEngineering and Applied Sciencesen
dc.language.isoen_USen
dc.publisherAssociation for Computing Machineryen
dc.relation.isversionofhttp://dx.doi.org/10.1145/780542.780631en
dash.licenseLAA
dc.titleRandomness-Efficient Low-Degree Tests and Short PCPs Via Epsilon-Biased Setsen
dc.relation.journalProceedings of the Annual ACM Symposium on Theory of Computingen
dash.depositing.authorVadhan, Salil
dc.identifier.doi10.1145/780542.780631*
dash.contributor.affiliatedVadhan, Salil


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