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dc.contributor.authorRecht, Daniel
dc.contributor.authorCapasso, Federico
dc.contributor.authorAziz, Michael J.
dc.date.accessioned2010-08-12T15:16:49Z
dc.date.issued2009
dc.identifier.citationRecht, Daniel, Federico Capasso, and Michael J. Aziz. 2009. On the temperature dependence of point-defect-mediated luminescence in silicon. Applied Physics Letters 94(25): 251113.en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:4341784
dc.description.abstractWe present a model of the temperature dependence of point-defect-mediated luminescence in silicon derived from basic kinetics and semiconductor physics and based on the kinetics of bound exciton formation. The model provides a good fit to data for W line electroluminescence and G line photoluminescence in silicon. Strategies are discussed for extending luminescence to room temperature.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.3157277en_US
dash.licenseLAA
dc.titleOn the Temperature Dependence of Point-Defect-Mediated Luminescence in Siliconen_US
dc.typeJournal Articleen_US
dc.description.versionVersion of Recorden_US
dc.relation.journalApplied Physics Lettersen_US
dash.depositing.authorCapasso, Federico
dc.date.available2010-08-12T15:16:49Z
dc.identifier.doi10.1063/1.3157277*
dash.contributor.affiliatedRecht, Daniel
dash.contributor.affiliatedCapasso, Federico
dash.contributor.affiliatedAziz, Michael


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