X-ray Reflectivity Study of Temperature-Dependent Surface Layering in Liquid Hg
DSpace/Manakin Repository
X-ray Reflectivity Study of Temperature-Dependent Surface Layering in Liquid Hg
| Title: | X-ray Reflectivity Study of Temperature-Dependent Surface Layering in Liquid Hg |
| Author: |
DiMasi, E.; Tostmann, H.; Ocko, B. M.; Pershan, Peter S.; Deutsch, M.
Note: Order does not necessarily reflect citation order of authors. |
| Citation: | DiMasi, E., H. Tostmann, B. M. Ocko, Peter S. Pershan, and M. Deutsch. 1998. X-ray reflectivity study of temperature-dependent surface layering in liquid Hg. Physical Review B 58(20): R13419–R13422. |
| Access Status: | At the direction of the depositing author this work is not currently accessible through DASH. |
| Full Text & Related Files: |
DiMasi_X-ray_PRB.pdf (107.0Kb; PDF) 
|
| Abstract: | We report x-ray reflectivity measurements of liquid mercury between -36 °C and +25 °C. The surface structure can be described by a layered density profile convolved with a thermal roughness σT. The layering has a spacing of 2.72 Å and an exponential decay length of 5.0 Å. Surprisingly, σT is found to increase considerably faster with temperature than the √T behavior predicted by capillary wave theory, in contrast with previous measurements on Ga and dielectric liquids. |
| Published Version: | doi:10.1103/PhysRevB.58.R13419 |
| Other Sources: | http://liquids.seas.harvard.edu/peter/1998.pdf/98_1_Hg.pdf |
| Citable link to this page: | http://nrs.harvard.edu/urn-3:HUL.InstRepos:4419624 |
This item appears in the following Collection(s)
-
FAS Scholarly Articles [5138]
Peer reviewed scholarly articles from the Faculty of Arts and Sciences of Harvard University
Contact administrator regarding this item (to report mistakes or request changes)
