X-ray Reflectivity Study of Temperature-Dependent Surface Layering in Liquid Hg

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X-ray Reflectivity Study of Temperature-Dependent Surface Layering in Liquid Hg

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dc.contributor.author DiMasi, E.
dc.contributor.author Tostmann, H.
dc.contributor.author Ocko, B. M.
dc.contributor.author Pershan, Peter S.
dc.contributor.author Deutsch, M.
dc.date.accessioned 2010-09-01T14:36:25Z
dc.date.issued 1998
dc.identifier.citation DiMasi, E., H. Tostmann, B. M. Ocko, Peter S. Pershan, and M. Deutsch. 1998. X-ray reflectivity study of temperature-dependent surface layering in liquid Hg. Physical Review B 58(20): R13419–R13422. en_US
dc.identifier.issn 1098-0121 en_US
dc.identifier.uri http://nrs.harvard.edu/urn-3:HUL.InstRepos:4419624
dc.description.abstract We report x-ray reflectivity measurements of liquid mercury between -36 °C and +25 °C. The surface structure can be described by a layered density profile convolved with a thermal roughness σT. The layering has a spacing of 2.72 Å and an exponential decay length of 5.0 Å. Surprisingly, σT is found to increase considerably faster with temperature than the √T behavior predicted by capillary wave theory, in contrast with previous measurements on Ga and dielectric liquids. en_US
dc.description.sponsorship Engineering and Applied Sciences en_US
dc.language.iso en_US en_US
dc.publisher American Physical Society en_US
dc.relation.isversionof doi:10.1103/PhysRevB.58.R13419 en_US
dc.relation.hasversion http://liquids.seas.harvard.edu/peter/1998.pdf/98_1_Hg.pdf en_US
dash.license META_ONLY
dc.title X-ray Reflectivity Study of Temperature-Dependent Surface Layering in Liquid Hg en_US
dc.type Journal Article en_US
dc.description.version Version of Record en_US
dc.relation.journal Physical Review B en_US
dash.depositing.author Pershan, Peter S.
dash.embargo.until 10000-01-01

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  • FAS Scholarly Articles [6464]
    Peer reviewed scholarly articles from the Faculty of Arts and Sciences of Harvard University

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