Pairing Interactions and Gibbs Adsorption at the Liquid Bi-In Surface: A Resonant X-Ray Reflectivity Study
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| dc.contributor.author |
DiMasi, E. |
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| dc.contributor.author |
Tostmann, H. |
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| dc.contributor.author |
Shpyrko, O. G. |
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| dc.contributor.author |
Huber, P. |
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| dc.contributor.author |
Ocko, B. M. |
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| dc.contributor.author |
Pershan, Peter S.
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| dc.contributor.author |
Deutsch, M. |
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| dc.contributor.author |
Berman, L. E. |
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| dc.date.accessioned |
2010-09-01T14:50:34Z |
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| dc.date.issued |
2001 |
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| dc.identifier.citation |
DiMasi, E., H. Tostmann, O. G. Shpyrko, P. Huber, B. M. Ocko, Peter S. Pershan, M. Deutsch, and L. E. Berman. 2001. Pairing interactions and Gibbs adsorption at the liquid Bi-In surface: A resonant x-ray reflectivity study. Physical Review Letters 86(8): 1538-1541. |
en_US |
| dc.identifier.issn |
0031-9007 |
en_US |
| dc.identifier.uri |
http://nrs.harvard.edu/urn-3:HUL.InstRepos:4419630 |
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| dc.description.abstract |
Resonant x-ray reflectivity measurements from the surface of liquid Bi22In78 find only a modest surface Bi enhancement, with 35 at.% Bi in the first atomic layer. This is in contrast to the Gibbs adsorption in all liquid alloys studied to date, which show surface segregation of a complete monolayer of the low surface tension component. This suggests that surface adsorption in Bi-In is dominated by attractive interactions that increase the number of Bi-In neighbors at the surface. These are the first measurements in which resonant x-ray scattering has been used to quantify compositional changes induced at a liquid alloy surface. |
en_US |
| dc.description.sponsorship |
Engineering and Applied Sciences |
en_US |
| dc.language.iso |
en_US |
en_US |
| dc.publisher |
American Physical Society |
en_US |
| dc.relation.isversionof |
doi:10.1103/PhysRevLett.86.1538 |
en_US |
| dc.relation.hasversion |
http://liquids.deas.harvard.edu/peter/2001.pdf/01_2_InBi.prl.pdf |
en_US |
| dash.license |
META_ONLY |
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| dc.title |
Pairing Interactions and Gibbs Adsorption at the Liquid Bi-In Surface: A Resonant X-Ray Reflectivity Study |
en_US |
| dc.type |
Journal Article |
en_US |
| dc.description.version |
Version of Record |
en_US |
| dc.relation.journal |
Physical Review Letters |
en_US |
| dash.depositing.author |
Pershan, Peter S.
|
|
| dash.embargo.until |
10000-01-01 |
|
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Peer reviewed scholarly articles from the Faculty of Arts and Sciences of Harvard University
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