| Title: | Microscopic Structure of the Wetting Film at the Surface of Liquid Ga-Bi Alloys |
| Author: |
Tostmann, H.; DiMasi, H.; Shpyrko, O. G.; Pershan, Peter S.; Ocko, B. M.; Deutsch, M.
Note: Order does not necessarily reflect citation order of authors. |
| Citation: | Tostmann, H., E. DiMasi, O. G. Shpyrko, Peter S. Pershan, B. M. Ocko, and M. Deutsch. 2000. Microscopic structure of the wetting film at the surface of liquid Ga-Bi alloys. Physical Review Letters 84(19): 4385-4388. |
| Access Status: | At the direction of the depositing author this work is not currently accessible through DASH. |
| Full Text & Related Files: |
Tostmann_Microscopic_PRL.pdf (267.9Kb; PDF)
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| Abstract: | X-ray reflectivity measurements of the binary liquid Ga-Bi alloy reveal a dramatically different surface structure above and below the monotectic temperature Tmono = 222°C. A Gibbs-adsorbed Bi monolayer resides at the surface in both regimes. However, a 30Å thick, Bi-rich wetting film intrudes between the Bi monolayer and the Ga-rich bulk for T>Tmono. The wetting film's internal structure, not hitherto measured, is determined with Å resolution, showing a concentration gradient not predicted by theory and a highly diffuse interface with the bulk phase. |
| Published Version: | doi:10.1103/PhysRevLett.84.4385 |
| Other Sources: | http://liquids.deas.harvard.edu/peter/2000.pdf/00_1_GaBi.pdf |
| Citable link to this page: | http://nrs.harvard.edu/urn-3:HUL.InstRepos:4428800 |
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