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dc.contributor.author	Pershan, Peter S.
dc.date.accessioned	2011-02-16T14:39:18Z
dc.date.issued	2009
dc.identifier.citation	Pershan, Peter S. 2009. X-ray scattering from liquid surfaces: Effect of resolution. Journal of Physical Chemistry B 113(12): 3639-3646.	en_US
dc.identifier.issn	1520-6106	en_US
dc.identifier.uri	http://nrs.harvard.edu/urn-3:HUL.InstRepos:4726289
dc.description.abstract	Quantitative interpretation of X-ray reflectivity measurements from liquid surfaces requires methodical accounting of the effects of diffuse scattering from thermal capillary roughness. In this paper we discuss how this requires careful attention to the shape of the experimental resolution. These considerations, which are essential for measurement of the intrinsic structure factor of a liquid surface, require knowledge of the liquid surface tension. The paper closes with a brief comment on the most sensitive method for extraction of the surface tension from measurement of the off-specular diffuse scattering.	en_US
dc.description.sponsorship	Engineering and Applied Sciences	en_US
dc.language.iso	en_US	en_US
dc.publisher	American Chemical Society	en_US
dc.relation.isversionof	doi:10.1021/jp806113n	en_US
dc.relation.hasversion	http://www.liquids.deas.harvard.edu/peter/2008.pdf/DeGennes.pdf	en_US
dash.license	META_ONLY
dc.title	X-ray Scattering From Liquid Surfaces: Effect of Resolution	en_US
dc.type	Journal Article	en_US
dc.description.version	Proof	en_US
dc.relation.journal	Journal of Physical Chemistry B	en_US
dash.depositing.author	Pershan, Peter S.
dash.embargo.until	10000-01-01

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  Peer reviewed scholarly articles from the Faculty of Arts and Sciences of Harvard University

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