X-Ray Reflectivity Studies of a Microemulsion Surface

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X-Ray Reflectivity Studies of a Microemulsion Surface

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dc.contributor.author Schwartz, D. K.
dc.contributor.author Braslau, A.
dc.contributor.author Ocko, B.
dc.contributor.author Pershan, Peter S.
dc.contributor.author Als-Nielsen, J.
dc.contributor.author Huang, J. S.
dc.date.accessioned 2012-04-24T16:14:38Z
dc.date.issued 1988
dc.identifier.citation Schwartz, D. K., A. Braslau, B. Ocko, Peter S. Pershan, J. Als-Nielsen, and J. S. Huang. 1988. X-ray reflectivity studies of a microemulsion surface. Physical Review A 38(11): 5817-5824. en_US
dc.identifier.issn 1050-2947 en_US
dc.identifier.uri http://nrs.harvard.edu/urn-3:HUL.InstRepos:8609121
dc.description.abstract The surface structure of the AOT (sodium di-2-ethylsulfosuccinate) microemulsion system with equal volume fractions of D2O and decane, for AOT volume fractions of 0.42, 0.305, and 0.181, has been studied by a combination of x-ray specular reflectivity and scattering from the bulk. Scattering from the bulk material below the surface is consistent with Kotlarchyk’s interpretation of densely packed spherical micelles. Specular reflectivity from the surface implies a surface electron-density profile consistent with one to two layers of microemulsion droplets. The size of and distance between droplets is consistent with the respective values for the droplets in the bulk phase. en_US
dc.description.sponsorship Engineering and Applied Sciences en_US
dc.language.iso en_US en_US
dc.publisher American Physical Society en_US
dc.relation.isversionof doi:10.1103/PhysRevA.38.5817 en_US
dash.license LAA
dc.title X-Ray Reflectivity Studies of a Microemulsion Surface en_US
dc.type Journal Article en_US
dc.description.version Version of Record en_US
dc.relation.journal Physical Review A en_US
dash.depositing.author Pershan, Peter S.
dc.date.available 2012-04-24T16:14:38Z

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  • FAS Scholarly Articles [7106]
    Peer reviewed scholarly articles from the Faculty of Arts and Sciences of Harvard University

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