Triaxial AFM Probes for Noncontact Trapping and Manipulation

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Triaxial AFM Probes for Noncontact Trapping and Manipulation

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Title: Triaxial AFM Probes for Noncontact Trapping and Manipulation
Author: Brown, Keith A.; Westervelt, Robert M.

Note: Order does not necessarily reflect citation order of authors.

Citation: Brown, Keith A., and Robert M. Westervelt. 2011. Triaxial AFM probes for noncontact trapping and manipulation. Nano Letters 11(8): 3197–3201.
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Abstract: We show that a triaxial atomic force microscopy probe creates a noncontact trap for a single particle in a fluid via negative dielectrophoresis. A zero in the electric field profile traps the particle above the probe surface, avoiding adhesion, and the repulsive region surrounding the zero pushes other particles away, preventing clustering. Triaxial probes are promising for three-dimensional assembly and for selective imaging of a particular property of a sample using interchangeable functionalized particles.
Published Version: doi:10.1021/nl201434t
Other Sources: http://www.ncbi.nlm.nih.gov/pubmed/21766811
Terms of Use: This article is made available under the terms and conditions applicable to Open Access Policy Articles, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#OAP
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:9453698

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  • FAS Scholarly Articles [6463]
    Peer reviewed scholarly articles from the Faculty of Arts and Sciences of Harvard University
 
 

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