High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes

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High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes

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Title: High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes
Author: Westervelt, Robert M.; Brown, Keith A.; Satziner, Kevin J.

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Citation: Brown, Keith A., Kevin J. Satziner, and Robert M. Westervelt. 2012. High spatial resolution Kelvin probe force microscopy with coaxial probes. Nanotechnology 23(11): 115703.
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Abstract: Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of KPFM is intrinsically limited by the long range of the electrostatic interaction, which includes contributions from the macroscopic cantilever and the conical tip. Here, we present coaxial AFM probes in which the cantilever and cone are shielded by a conducting shell, confining the tip-sample electrostatic interaction to a small region near the end of the tip. We have developed a technique to measure the true CPD despite the presence of the shell electrode. We find the behavior of these probes agrees with an electrostatic model of the force, and we observe a factor of 5 improvement in spatial resolution relative to unshielded probes. Our discussion centers on KPFM, but the field confinement offered by these probes may improve any variant of electrostatic force microscopy.
Published Version: doi:10.1088/0957-4484/23/11/115703
Terms of Use: This article is made available under the terms and conditions applicable to Open Access Policy Articles, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#OAP
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:9639955

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  • FAS Scholarly Articles [6948]
    Peer reviewed scholarly articles from the Faculty of Arts and Sciences of Harvard University
 
 

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