High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes

High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes

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High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes

dc.contributor.author	Westervelt, Robert M.
dc.contributor.author	Brown, Keith A.
dc.contributor.author	Satziner, Kevin J.
dc.date.accessioned	2012-09-25T18:26:37Z
dc.date.issued	2012
dc.identifier.citation	Brown, Keith A., Kevin J. Satziner, and Robert M. Westervelt. 2012. High spatial resolution Kelvin probe force microscopy with coaxial probes. Nanotechnology 23(11): 115703.	en_US
dc.identifier.issn	0957-4484	en_US
dc.identifier.uri	http://nrs.harvard.edu/urn-3:HUL.InstRepos:9639955
dc.description.abstract	Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of KPFM is intrinsically limited by the long range of the electrostatic interaction, which includes contributions from the macroscopic cantilever and the conical tip. Here, we present coaxial AFM probes in which the cantilever and cone are shielded by a conducting shell, confining the tip-sample electrostatic interaction to a small region near the end of the tip. We have developed a technique to measure the true CPD despite the presence of the shell electrode. We find the behavior of these probes agrees with an electrostatic model of the force, and we observe a factor of 5 improvement in spatial resolution relative to unshielded probes. Our discussion centers on KPFM, but the field confinement offered by these probes may improve any variant of electrostatic force microscopy.	en_US
dc.description.sponsorship	Engineering and Applied Sciences	en_US
dc.language.iso	en_US	en_US
dc.publisher	Institute of Physics	en_US
dc.relation.isversionof	doi:10.1088/0957-4484/23/11/115703	en_US
dash.license	OAP
dc.subject	accelerators	en_US
dc.subject	beams and electromagnetism	en_US
dc.subject	instrumentation and measurement	en_US
dc.subject	surfaces, interfaces, and thin films	en_US
dc.title	High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes	en_US
dc.type	Journal Article	en_US
dc.description.version	Accepted Manuscript	en_US
dc.relation.journal	Nanotechnology	en_US
dash.depositing.author	Westervelt, Robert M.
dc.date.available	2012-09-25T18:26:37Z