High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes

DSpace/Manakin Repository

High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes

Show simple item record

dc.contributor.author Westervelt, Robert M.
dc.contributor.author Brown, Keith A.
dc.contributor.author Satziner, Kevin J.
dc.date.accessioned 2012-09-25T18:26:37Z
dc.date.issued 2012
dc.identifier.citation Brown, Keith A., Kevin J. Satziner, and Robert M. Westervelt. 2012. High spatial resolution Kelvin probe force microscopy with coaxial probes. Nanotechnology 23(11): 115703. en_US
dc.identifier.issn 0957-4484 en_US
dc.identifier.uri http://nrs.harvard.edu/urn-3:HUL.InstRepos:9639955
dc.description.abstract Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of KPFM is intrinsically limited by the long range of the electrostatic interaction, which includes contributions from the macroscopic cantilever and the conical tip. Here, we present coaxial AFM probes in which the cantilever and cone are shielded by a conducting shell, confining the tip-sample electrostatic interaction to a small region near the end of the tip. We have developed a technique to measure the true CPD despite the presence of the shell electrode. We find the behavior of these probes agrees with an electrostatic model of the force, and we observe a factor of 5 improvement in spatial resolution relative to unshielded probes. Our discussion centers on KPFM, but the field confinement offered by these probes may improve any variant of electrostatic force microscopy. en_US
dc.description.sponsorship Engineering and Applied Sciences en_US
dc.language.iso en_US en_US
dc.publisher Institute of Physics en_US
dc.relation.isversionof doi:10.1088/0957-4484/23/11/115703 en_US
dash.license OAP
dc.subject accelerators en_US
dc.subject beams and electromagnetism en_US
dc.subject instrumentation and measurement en_US
dc.subject surfaces, interfaces, and thin films en_US
dc.title High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes en_US
dc.type Journal Article en_US
dc.description.version Accepted Manuscript en_US
dc.relation.journal Nanotechnology en_US
dash.depositing.author Westervelt, Robert M.
dc.date.available 2012-09-25T18:26:37Z

Files in this item

Files Size Format View
Westervelt_HighSpatial.pdf 1.802Mb PDF View/Open
Westervelt_HighSpatial.doc 1.333Mb Microsoft Word View/Open

This item appears in the following Collection(s)

  • FAS Scholarly Articles [6464]
    Peer reviewed scholarly articles from the Faculty of Arts and Sciences of Harvard University

Show simple item record

 
 

Search DASH


Advanced Search
 
 

Submitters