Microcantilever Q Control Via Capacitive Coupling
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| dc.contributor.author |
Hoffman, Jenny Eve
|
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| dc.contributor.author |
Huefner, Magdalena
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| dc.contributor.author |
Pivonka, Adam |
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| dc.contributor.author |
Ye, Cun |
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| dc.contributor.author |
Blood-Forsythe, Martin Ashby
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| dc.contributor.author |
Zech, Martin |
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| dc.contributor.author |
Kim, Jeehoon |
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| dc.date.accessioned |
2012-11-20T14:33:38Z |
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| dc.date.issued |
2012 |
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| dc.identifier.citation |
Huefner, Magdalena, Adam Pivonka, Jeehoon Kim, Cun Ye, Martin A. Blood-Forsythe, Martin Zech, and Jennifer E. Hoffman. 2012. Microcantilever Q control via capacitive coupling. Applied Physics Letters 101(17): 173110. |
en_US |
| dc.identifier.issn |
0003-6951 |
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| dc.identifier.uri |
http://nrs.harvard.edu/urn-3:HUL.InstRepos:9925387 |
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| dc.description.abstract |
We introduce a versatile method to control the quality factor Q of a conducting cantilever in an atomic force microscope (AFM) via capacitive coupling to the local environment. Using this method, Q may be reversibly tuned to within ~ 10% of any desired value over several orders of magnitude. A point-mass oscillator model describes the measured effect. Our simple Q control module increases the AFM functionality by allowing greater control of parameters such as scan speed and force gradient sensitivity, which we demonstrate by topographic imaging of a VO\(_{2}\) thin film in high vacuum. |
en_US |
| dc.description.sponsorship |
Physics |
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| dc.language.iso |
en_US |
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| dc.publisher |
American Institute of Physics |
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| dc.relation.isversionof |
doi:10.1063/1.4764025 |
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| dash.license |
LAA |
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| dc.subject |
atomic force microscopy |
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| dc.subject |
cantilevers |
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| dc.subject |
micromechanical devices |
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| dc.subject |
oscillators |
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| dc.subject |
Q-factor |
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| dc.subject |
thin films |
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| dc.subject |
vacuum techniques |
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| dc.title |
Microcantilever Q Control Via Capacitive Coupling |
en_US |
| dc.type |
Journal Article |
en_US |
| dc.description.version |
Version of Record |
en_US |
| dc.relation.journal |
Applied Physics Letters |
en_US |
| dash.depositing.author |
Hoffman, Jenny Eve
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|
| dc.date.available |
2012-11-20T14:33:38Z |
|
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FAS Scholarly Articles [5138]
Peer reviewed scholarly articles from the Faculty of Arts and Sciences of Harvard University
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