Now showing items 1-2 of 2

    • Failure Analysis of Electronic Material Using Cryogenic FIB-SEM 

      Antoniou, Nicholas; Graham, Adam; Hartfield, Cheryl; Amador, Gonzalo (ASM International, 2012)
      Two-beam systems (focused ion beam (FIB) integrated with a scanning electron microscope (SEM)) have enabled site-specific analysis at the nano-scale through in situ "mill and view" capability at high resolution. In addition, ...
    • Long-Term Implant Fibrosis Prevention in Rodents and Non-Human Primates Using Localized Deliverable Crystals 

      Farah, Shady; Doloff, Joshua; Han, Hye Jung; Olafson, Katy; McAvoy, Malia; Graham, Adam; Langer, Robert; Anderson, Daniel; Sadraei, Atieh; Vyas, Keval; Tam, Hok Hei; Holliser-Locke, Jennifer; Kowalski, Piotr; Griffin, Marissa; Ashley, Meng; McGarrigle, James; Oberholzer, Jose; Weir, Gordon; Greiner, Dale (Nature Publishing Group, 2019-06-24)
      Implantable medical devices have revolutionized modern medicine. However, immune-mediated foreign body response (FBR) to the materials of these devices can limit their function or even induce failure. Here we describe ...