Browsing by Author "Kim, Wonyoung"
Now showing items 1-5 of 5
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A fully integrated battery-connected switched-capacitor 4:1 voltage regulator with 70% peak efficiency using bottom-plate charge recycling
Tong, Tao; Zhang, Xuan; Kim, Wonyoung; Brooks, David M.; Wei, Gu-Yeon (2016-02-24)This work presents a switched-capacitor (SC) DC-DC voltage regulator that converts a 3.7V battery voltage down to ~0.8V in order to power the `brain' SoC of a flapping-wing microrobotic bee. A cascade of two 2:1 SC converters ... -
A fully-integrated 3-level DC/DC converter for nanosecond-scale DVS with fast shunt regulation
Kim, Wonyoung; Brooks, David M.; Wei, Gu-Yeon (IEEE, 2011)In recent years, chip multiprocessor architectures have emerged to scale performance while staying within tight power constraints. This trend motivates per core/block dynamic voltage and frequency scaling (DVFS) with fast ... -
Reducing Power Loss, Cost and Complexity of SoC Power Delivery Using Integrated 3-Level Voltage Regulators
Kim, Wonyoung (2013-03-18)Traditional methods of system-on-chip (SoC) power management based on dynamic voltage and frequency scaling (DVFS) is limited by 1) cores/IP blocks sharing a voltage domain provided by off-chip voltage regulators (VR) and ... -
Voltage Noise in Production Processors
Janapa Reddi, Vijay; Kanev, Svilen; Kim, Wonyoung; Campanoni, Simone; Smith, Michael D.; Wei, Gu-Yeon; Brooks, David M. (Institute of Electrical & Electronics Engineers (IEEE), 2011)Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they ... -
Voltage Smoothing: Characterizing and Mitigating Voltage Noise in Production Processors via Software-Guided Thread Scheduling
Reddi, Vijay Janapa; Kanev, Svilen; Kim, Wonyoung; Campanoni, Simone; Smith, Michael D.; Wei, Gu-Yeon; Brooks, David M. (IEEE, 2010)Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is especially daunting because it happens so rapidly. We measure and characterize voltage variation in a running Intel Core2 ...