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    • High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes 

      Brown, Keith A.; Satziner, Kevin J.; Westervelt, Robert M. (Institute of Physics, 2012)
      Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of ...