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Surface Roughness of Water Measured by X-Ray Reflectivity
(American Physical Society, 1985)
The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation \((\lambda \sim1.5 \mathring{A})\), the angular dependence of the x-ray reflectivity ...
X-Ray Scattering Study of Restacking Transitions in the Crystalline-B Phases of Heptyloxybenzylidene Heptylaniline (7O.7)
(American Physical Society, 1985)
This paper reports a comprehensive x-ray diffraction study of the structure and the restacking transitions which occur within the crystalline-B phases of N-[4-(n-heptyl)oxybenzylidene]-4’-(n-heptyl)aniline (7O.7). Between ...