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X-Ray Studies of Tilted Hexatic Phases in Thin Liquid-Crystal Films
(American Physical Society, 1985)
X-ray-diffraction studies of the structures and phase transitions of the tilted hexatic phases (smectic F and smectic I) in thin liquid-crystal films of 4-n-heptyloxybenzylidene-4-n-heptylaniline (70.7) are reported. The ...
Criteria for Designing Computer Facilities for Linguistic Analysis
(Walter de Gruyter, 1985)
Abstract: In the natural-language-processing research community, the usefulness of computer tools for testing linguistic analyses is often taken for granted. Linguists, on the other hand, have generally been unaware of or ...
X-Ray Scattering Study of the \(Smectic-A_1\) to \(Smectic-A_2\) Transition
(American Physical Society, 1985)
X-ray scattering measurements are reported for critical \(smectic-A_2\) fluctuations along a line of second-order transitions between the \(smectic-A_1\) and \(smectic-A_2\) phases in mixtures of hexylphenyl cyanobenzoyloxy ...
Integrated X-Ray-Scattering Intensity Measurement of the Order Parameter at the Nematic-to-Smectic-A Phase Transition
(American Physical Society, 1985)
The temperature dependence of the square of the smectic order parameter, \(\mid \psi \mid^2\), was determined from the integrated x-ray scattering intensity. The data are described very well by the form \(I(t)/I(0)=1 \mp ...
Tradition and Japanese Social Organization: Institutional Development in a Tokyo Neighborhood
(University of Pittsburgh, 1985)
Surface Roughness of Water Measured by X-Ray Reflectivity
(American Physical Society, 1985)
The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation \((\lambda \sim1.5 \mathring{A})\), the angular dependence of the x-ray reflectivity ...
Irish Literature: Saga
(Charles Scribner's Sons, 1985)
X-Ray Scattering Study of Restacking Transitions in the Crystalline-B Phases of Heptyloxybenzylidene Heptylaniline (7O.7)
(American Physical Society, 1985)
This paper reports a comprehensive x-ray diffraction study of the structure and the restacking transitions which occur within the crystalline-B phases of N-[4-(n-heptyl)oxybenzylidene]-4’-(n-heptyl)aniline (7O.7). Between ...
Structural Relaxation of Amorphous \(Pd_{82}Si_{18}\): X-Ray Measurements, Electrical-Resistivity Measurements, and a Comparison Using the Ziman Theory
(American Physical Society, 1985)
Structural relaxation in amorphous \(Pd_{82}Si_{18}\) is studied using high-precision x-ray diffraction. The x-ray structure factor S(k) and the density ρ (determined from the x-ray absorption), are measured simultaneously ...