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  • Pershan, Peter (28)
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Unification and Grammatical Theory 

Sag, Ivan A.; Kaplan, Ronald; Karttunen, Lauri; Kay, Martin; Pollard, Carl; Shieber, Stuart M.; Zaenen, Annie (Cascadilla Press, 1986)
This paper informally presents a new view of grammar that has emerged from a number of distinct but related lines of investigation in theoretical and computational linguistics. Under this view, many current linguistic ...
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X-Ray Studies of Tilted Hexatic Phases in Thin Liquid-Crystal Films 

Sirota, E. B.; Pershan, Peter S.; Sorensen, L. B.; Collett, J. (American Physical Society, 1985)
X-ray-diffraction studies of the structures and phase transitions of the tilted hexatic phases (smectic F and smectic I) in thin liquid-crystal films of 4-n-heptyloxybenzylidene-4-n-heptylaniline (70.7) are reported. The ...
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Smectic-A Order at the Surface of a Nematic Liquid Crystal: Synchrotron X-Ray Diffraction 

Als-Nielsen, J.; Christensen, F.; Pershan, Peter S. (American Physical Society, 1982)
A novel geometry in which it is possible to do x-ray diffraction from a horizontal surface of fluids is applied to liquid crystals. A large-diameter drop of octyloxycyanobiphenyl (8OCB) on a glass plate treated for homeotropic ...
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Criteria for Designing Computer Facilities for Linguistic Analysis 

Shieber, Stuart M. (Walter de Gruyter, 1985)
Abstract: In the natural-language-processing research community, the usefulness of computer tools for testing linguistic analyses is often taken for granted. Linguists, on the other hand, have generally been unaware of or ...

The Structure of Self-Assembled Monolayers of Alkylsiloxanes on Silicon: A Comparison of Results from Ellipsometry and Low-Angle X-Ray Reflectivity 

Wasserman, Stephen R.; Whitesides, George M.; Tidswell, Ian M.; Ocko, Ben M.; Pershan, Peter S.; Axe, John D. (American Chemical Society, 1989)
The thicknesses of C10-C18 alkylsiloxane monolayers on silicon-silicon dioxide substrates have been measured with ellipsometry and low-angle X-ray reflection. Although, for any given sample, thicknesses measured by the two ...
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Smectic Layering at the Free Surface of Liquid Crystals in the Nematic Phase: X-Ray Reflectivity 

Pershan, Peter S.; Braslau, A.; Weiss, A. H.; Als-Nielsen, J. (American Physical Society, 1987)
Smectic layering at the surface and smectic fluctuations in the bulk can be studied simultaneously by x-ray specular reflectivity and scattering measurements. There is a peak in the angular dependence of the specular ...
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Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films 

Collett, Jeffrey; Pershan, Peter S.; Sirota, Eric B.; Sorensen, L. B. (American Physical Society, 1984)
The phase diagram of freely suspended thin films of heptyloxybenzylidene-heptylaniline shows dramatic changes for thicknesses below 22 layers. The most surprising feature of the phase diagram is the inclusion of two phases ...

Synchrotron X-Ray Diffraction Study of Liquid Surfaces 

Als-Nielsen, J.; Pershan, Peter S. (Elsevier, 1983)
A spectrometer for X-ray diffraction and refraction studies of horizontal, free surfaces of liquids is described. As an illustration smetic-A layering at the surface of a liquid crystal is presented.
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X-Ray Scattering Study of the \(Smectic-A_1\) to \(Smectic-A_2\) Transition 

Chan, K. K.; Pershan, Peter S.; Sorensen, L. B.; Hardouin, F. (American Physical Society, 1985)
X-ray scattering measurements are reported for critical \(smectic-A_2\) fluctuations along a line of second-order transitions between the \(smectic-A_1\) and \(smectic-A_2\) phases in mixtures of hexylphenyl cyanobenzoyloxy ...
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Integrated X-Ray-Scattering Intensity Measurement of the Order Parameter at the Nematic-to-Smectic-A Phase Transition 

Chan, Kelby K.; Deutsch, Moshe; Ocko, B. M.; Pershan, Peter S.; Sorensen, L. B. (American Physical Society, 1985)
The temperature dependence of the square of the smectic order parameter, \(\mid \psi \mid^2\), was determined from the integrated x-ray scattering intensity. The data are described very well by the form \(I(t)/I(0)=1 \mp ...
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