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Criteria for Designing Computer Facilities for Linguistic Analysis
(Walter de Gruyter, 1985)
Abstract: In the natural-language-processing research community, the usefulness of computer tools for testing linguistic analyses is often taken for granted. Linguists, on the other hand, have generally been unaware of or ...
X-Ray Studies of Tilted Hexatic Phases in Thin Liquid-Crystal Films
(American Physical Society, 1985)
X-ray-diffraction studies of the structures and phase transitions of the tilted hexatic phases (smectic F and smectic I) in thin liquid-crystal films of 4-n-heptyloxybenzylidene-4-n-heptylaniline (70.7) are reported. The ...
Surface Roughness of Water Measured by X-Ray Reflectivity
(American Physical Society, 1985)
The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation \((\lambda \sim1.5 \mathring{A})\), the angular dependence of the x-ray reflectivity ...
X-Ray Scattering Study of Restacking Transitions in the Crystalline-B Phases of Heptyloxybenzylidene Heptylaniline (7O.7)
(American Physical Society, 1985)
This paper reports a comprehensive x-ray diffraction study of the structure and the restacking transitions which occur within the crystalline-B phases of N-[4-(n-heptyl)oxybenzylidene]-4’-(n-heptyl)aniline (7O.7). Between ...
Structural Relaxation of Amorphous \(Pd_{82}Si_{18}\): X-Ray Measurements, Electrical-Resistivity Measurements, and a Comparison Using the Ziman Theory
(American Physical Society, 1985)
Structural relaxation in amorphous \(Pd_{82}Si_{18}\) is studied using high-precision x-ray diffraction. The x-ray structure factor S(k) and the density ρ (determined from the x-ray absorption), are measured simultaneously ...
Integrated X-Ray-Scattering Intensity Measurement of the Order Parameter at the Nematic-to-Smectic-A Phase Transition
(American Physical Society, 1985)
The temperature dependence of the square of the smectic order parameter, \(\mid \psi \mid^2\), was determined from the integrated x-ray scattering intensity. The data are described very well by the form \(I(t)/I(0)=1 \mp ...
X-Ray Scattering Study of the \(Smectic-A_1\) to \(Smectic-A_2\) Transition
(American Physical Society, 1985)
X-ray scattering measurements are reported for critical \(smectic-A_2\) fluctuations along a line of second-order transitions between the \(smectic-A_1\) and \(smectic-A_2\) phases in mixtures of hexylphenyl cyanobenzoyloxy ...
Using restriction to extend parsing algorithms for complex-feature-based formalisms
(Association for Computational Linguistics, 1985)
Grammar formalisms based on the encoding of grammatical information in complex-valued feature systems enjoy some currency both in linguistics and natural-language-processing research. Such formalisms can be thought of by ...
Pressure dependence of arsenic diffusivity in silicon
(American Institute of Physics, 1985)
The diffusivity of implanted As in crystalline Si has been measured using Rutherford backscattering and channeling for specimens annealed at temperatures between 850 and 1000 °C under hydrostatic pressures up to 30 kbar. ...
Evidence against the context-freeness of natural language
(Springer, 1985)