Wrinkling Phenomena in Neo-Hookean Film/Substrate Bilayers
MetadataShow full item record
CitationCao, Yanping, and John W. Hutchinson. 2012. Wrinkling phenomena in neo-Hookean film/substrate bilayers. Journal of Applied Mechanics 79(3): 031019.
AbstractWrinkling modes are determined for a two-layer system comprised of a neo-Hookean film bonded to an infinitely deep neo-Hookean substrate with the entire bilayer undergoing compression. The full range of the film/substrate modulus ratio is considered from the limit of a traction-free homogeneous substrate to very stiff films on compliant substrates. The role of substrate prestretch is considered wherein an unstretched film is bonded to a prestretched substrate with wrinkling arising as the stretch in the substrate is relaxed. An exact bifurcation analysis reveals the critical strain in the film at the onset of wrinkling. Numerical simulations carried out within a finite element framework uncover advanced post-bifurcation modes including period-doubling, folding and a newly identified mountain ridge mode.
Citable link to this pagehttp://nrs.harvard.edu/urn-3:HUL.InstRepos:10169558
- FAS Scholarly Articles