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dc.contributor.authorGrigoriev, Alexei
dc.contributor.authorShpyrko, Oleg
dc.contributor.authorSteimer, Christoph
dc.contributor.authorPershan, Peter S.
dc.contributor.authorOcko, Benjamin M.
dc.contributor.authorDeutsch, Moshe
dc.contributor.authorLin, Binhua
dc.contributor.authorMeron, Mati
dc.contributor.authorGraber, Timothy
dc.contributor.authorGebhardt, Jeffrey
dc.date.accessioned2013-02-28T15:00:05Z
dc.date.issued2005
dc.identifier.citationGrigoriev, Alexei, Oleg Shpyrko, Christoph Steimer, Peter S. Pershan, Benjamin M. Ocko, Moshe Deutsch, Binhua Lin, Mati Meron, Timothy Graber, and Jeffrey Gebhardt. 2005. Surface oxidation of liquid Sn. Surface Science 575(3): 223-232.en_US
dc.identifier.issn0039-6028en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:10354242
dc.description.abstractWe report the results of an X-ray scattering study that reveals oxidation kinetics and formation of a previously unreported crystalline phase of SnO at the liquid–vapour interface of Sn. Our experiments reveal that the pure liquid Sn surface does not react with molecular oxygen below an activation pressure of \(\sim\)5.0 × 10\(^{−6}\) Torr. Above that pressure a rough solid Sn oxide grows over the liquid metal surface. Once the activation pressure has been exceeded the oxidation proceeds at pressures below the oxidation pressure threshold. The observed diffraction pattern associated with the surface oxidation does not match any of the known Sn oxide phases. The data have an explicit signature of the face-centred cubic structure, however it requires lattice parameters that are about 9% smaller than those reported for cubic structures of high-pressure phases of Sn oxides.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherElsevieren_US
dc.relation.isversionofdoi:10.1016/j.susc.2004.10.034en_US
dc.relation.hasversionhttp://www.liquids.deas.harvard.edu/peter/2005.pdf/Snoxide_2005.pdfen_US
dash.licenseMETA_ONLY
dc.subjectx-ray scattering, diffraction, and reflectionen_US
dc.subjectoxidationen_US
dc.subjectsurface chemical reactionen_US
dc.subjectsurface structure, morphology, roughness, and topographyen_US
dc.subjecttinen_US
dc.subjecttin oxidesen_US
dc.subjectliquid surfacesen_US
dc.subjectpolycrystalline thin filmsen_US
dc.titleSurface Oxidation of Liquid Snen_US
dc.typeJournal Articleen_US
dc.description.versionVersion of Recorden_US
dc.relation.journalSurface Scienceen_US
dash.depositing.authorPershan, Peter S.
dash.embargo.until10000-01-01
dc.identifier.doi10.1016/j.susc.2004.10.034*
dash.contributor.affiliatedPershan, Peter


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