X-Ray Specular Reflectivity of the \(^4He\) Liquid-Vapor Interface
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CitationLurio, L. B., T. A. Rabedeau, Peter S. Pershan, and Isaac F. Silvera. 1991. X-ray specular reflectivity of the \(^4He\) liquid-vapor interface. Physica B 169(1-4): 507-508.
AbstractX-ray specular reflectivity measurements of a saturated film of helium absorbed onto an atomically flat silicon substrate have been made at several temperatures. The thickness of the film has been determined and some preliminary data on the structure of the \(^4He\) liquid-vapor interface are reported.
Citable link to this pagehttp://nrs.harvard.edu/urn-3:HUL.InstRepos:10357457
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