# X-Ray Specular Reflectivity of the $$^4He$$ Liquid-Vapor Interface

 Title: X-Ray Specular Reflectivity of the $$^4He$$ Liquid-Vapor Interface Author: Lurio, L. B.; Rabedeau, T. A.; Pershan, Peter S.; Silvera, Isaac F. Note: Order does not necessarily reflect citation order of authors. Citation: Lurio, L. B., T. A. Rabedeau, Peter S. Pershan, and Isaac F. Silvera. 1991. X-ray specular reflectivity of the $$^4He$$ liquid-vapor interface. Physica B 169(1-4): 507-508. Access Status: Full text of the requested work is not available in DASH at this time (“dark deposit”). For more information on dark deposits, see our FAQ. Full Text & Related Files: Lurio_X-ray_1990.pdf (160.6Kb; PDF) Abstract: X-ray specular reflectivity measurements of a saturated film of helium absorbed onto an atomically flat silicon substrate have been made at several temperatures. The thickness of the film has been determined and some preliminary data on the structure of the $$^4He$$ liquid-vapor interface are reported. Published Version: doi:10.1016/0921-4526(91)90299-T Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:10357457 Downloads of this work: