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dc.contributor.authorAmador, S. M.
dc.contributor.authorPershan, Peter S.
dc.date.accessioned2013-03-01T13:41:59Z
dc.date.issued1990
dc.identifier.citationAmador, S. M. and Peter S. Pershan. 1990. Light-scattering and ellipsometry studies of the two-dimensional smectic-C to smectic-A transition in thin liquid-crystal films. Physical Review A 41(8): 4326-4334.en_US
dc.identifier.issn1050-2947en_US
dc.identifier.issn1094-1622en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:10357458
dc.description.abstractEllipsometry and light-scattering measurements are presented for the critical region near the two-dimensional XY-like smectic-C to smectic-A phase transition in thin, freely suspended films of the liquid crystal p-decyloxybenzylidene p-aminocinnamaic acid 2-methylbutyl ester. The macro-scopically observed smectic-C tilt order parameter was found to obey a scaling relation as a function of temperature and film thickness, indicating that only the surface layers order over a wide range of temperatures. Deep within the smectic-C phase, the tilt order parameters for all thickness films measured converged upon a unique value at which the smectic-C to smectic-I transition took place. The light-scattering intensities and decay times above the smectic-C to smectic-A transition were found to scale with the Kosterlitz-Thouless correlation length, as predicted by dynamical theories of the transition. Measurements of the predicted Nelson-Kosterlitz universal jump in \(\theta\) concurred with estimates for the bulk material parameters and with the light-scattering results.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofdoi:10.1103/PhysRevA.41.4326en_US
dc.relation.hasversionhttp://www.ncbi.nlm.nih.gov/pubmed/9903626en_US
dash.licenseLAA
dc.titleLight-Scattering and Ellipsometry Studies of the Two-Dimensional Smectic-C to Smectic-A Transition in Thin Liquid-Crystal Filmsen_US
dc.typeJournal Articleen_US
dc.description.versionVersion of Recorden_US
dc.relation.journalPhysical Review Aen_US
dash.depositing.authorPershan, Peter S.
dc.date.available2013-03-01T13:41:59Z
dc.identifier.doi10.1103/PhysRevA.41.4326*
dash.contributor.affiliatedPershan, Peter


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