Synchrotron X-Ray Observation of Surface Smectic-I Hexatic Layers on Smectic-C Liquid-Crystal Films

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Synchrotron X-Ray Observation of Surface Smectic-I Hexatic Layers on Smectic-C Liquid-Crystal Films

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Title: Synchrotron X-Ray Observation of Surface Smectic-I Hexatic Layers on Smectic-C Liquid-Crystal Films
Author: Sirota, E. B.; Pershan, Peter S.; Amador, Suzanne; Sorensen, L. B.

Note: Order does not necessarily reflect citation order of authors.

Citation: Sirota, E. B., Peter S. Pershan, Suzanne Amador, and L. B. Sorensen. 1987. Synchrotron x-ray observation of surface smectic-I hexatic layers on smectic-C liquid-crystal films. Physical Review A 35(5): 2283-2287.
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Abstract: Synchrotron x-ray diffraction methods employing a position-sensitive detector were used to study smectic-C (SmC) and smectic-I (SmI) phases in thin (2–6 molecular layers) liquid-crystal films of 4-(n-heptyloxy)benzylidene-4-(n-heptyl)aniline (7O.7). Above \(\sim 78^{\circ}C\), the entire film is SmC and below \(\sim 69^{\circ}C\), the entire film is SmI, a stacked tilted hexatic. Between \(69^{\circ}C and 78^{\circ}C\), the surface layers of the films are hexatic SmI and the interior layers are SmC. There is a pretransitional broadening of the surface hexatic peaks as the surface layers melt into the SmC phase.
Published Version: doi:10.1103/PhysRevA.35.2283
Terms of Use: This article is made available under the terms and conditions applicable to Other Posted Material, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#LAA
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:10357475
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