Liquid Surface Order: X-Ray Reflectivity

 
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https://doi.org/10.1016/0378-4371(95)00456-4
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Pershan, Peter S. 1996. Liquid surface order: X-ray reflectivity. Physica A: Statistical and Theoretical Physics 231(1-3): 111-116.
Abstract
This note contains a brief summary of how the X-ray specular reflectivity technique can be used to measure electron density profiles across the bulk/vapor interface for a variety of liquids.
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ftp://ftp.ill.fr/pub/lss/Ekater/New%20Folder/12.pdf
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http://nrs.harvard.edu/urn-3:HUL.InstRepos:10357481

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