Surface Layering in Liquid Gallium: An X-Ray Reflectivity Study

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Surface Layering in Liquid Gallium: An X-Ray Reflectivity Study

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Title: Surface Layering in Liquid Gallium: An X-Ray Reflectivity Study
Author: Regan, M. J.; Kawamoto, E. H.; Lee, S.; Pershan, Peter S.; Maskil, N.; Deutsch, M.; Magnussen, O. M.; Ocko, B. M.; Berman, L. E.

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Citation: Regan, M. J., E. H. Kawamoto, S. Lee, and Peter S. Pershan, N. Maskil, M. Deutsch, O. M. Magnussen, B. M. Ocko, and L. E. Berman. 1995. Surface layering in liquid gallium: An x-ray reflectivity study. Physical Review Letters 75(13): 2498–2501.
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Abstract: Surface-induced atomic layering in liquid gallium has been observed using x-ray reflectivity, ultrahigh vacuum conditions, and sputtered clean surfaces. Reflectivity data, collected on a supercooled liquid sample to momentum transfers as large as \(q_z\) = 3.0 Å\(^{-1}\), exhibit a strong maximum near 2.4 Å\(^{-1}\) indicating a layer spacing that is comparable to its atomic dimensions. The amplitude of the electron density oscillations decays with a characteristic length of 6 Å. This is unexpectedly twice that of recent results for Hg, and the difference may be related to covalent bonding or supercooling.
Published Version: doi:10.1103/PhysRevLett.75.2498
Other Sources: http://liquids.seas.harvard.edu/peter/old.pdf/metal_12.pdf
Terms of Use: This article is made available under the terms and conditions applicable to Other Posted Material, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#LAA
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:10357490
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