# The Effects of Surface Profile and Interface Correlations on X-Ray Reflectivity from Fluid Interfaces

 Title: The Effects of Surface Profile and Interface Correlations on X-Ray Reflectivity from Fluid Interfaces Author: Pershan, Peter S. Citation: Pershan, Peter S. 1994. The effects of surface profile and interface correlations on X-ray reflectivity from fluid interfaces. Journal of Physics: Condensed Matter 6(23A): A37-A50. Access Status: Full text of the requested work is not available in DASH at this time (“dark deposit”). For more information on dark deposits, see our FAQ. Full Text & Related Files: Pershan_Effects_Surface.pdf (704.5Kb; PDF) Abstract: Following a brief review of the physics by which X-ray scattering can be made surface sensitive, we will discuss some details of the effects that interfacial roughness and asymmetry of interfacial profiles have on measurements of X-ray specular reflectivity. Experiments related to these effects, including study of the width and interfacial roughness of the liquid/vapour interface for $$H_{2}O$$, superfluid $$^4$$He, thin wetting films of cyclohexane on Si, and metallic liquid Ga, have been reviewed elsewhere. Published Version: doi: 10.1088/0953-8984/6/23A/005 Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:10357531 Downloads of this work: