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dc.contributor.authorPershan, Peter S.
dc.date.accessioned2013-03-01T15:59:22Z
dc.date.issued1994
dc.identifier.citationPershan, Peter S. 1994. The effects of surface profile and interface correlations on X-ray reflectivity from fluid interfaces. Journal of Physics: Condensed Matter 6(23A): A37-A50.en_US
dc.identifier.issn0953-8984en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:10357531
dc.description.abstractFollowing a brief review of the physics by which X-ray scattering can be made surface sensitive, we will discuss some details of the effects that interfacial roughness and asymmetry of interfacial profiles have on measurements of X-ray specular reflectivity. Experiments related to these effects, including study of the width and interfacial roughness of the liquid/vapour interface for \(H_{2}O\), superfluid \(^4\)He, thin wetting films of cyclohexane on Si, and metallic liquid Ga, have been reviewed elsewhere.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherInstitute of Physicsen_US
dc.relation.isversionofdoi: 10.1088/0953-8984/6/23A/005en_US
dash.licenseMETA_ONLY
dc.subjectliquids and polymersen_US
dc.subjectinterfaces and thin filmsen_US
dc.subjectsoft matteren_US
dc.titleThe Effects of Surface Profile and Interface Correlations on X-Ray Reflectivity from Fluid Interfacesen_US
dc.typeJournal Articleen_US
dc.description.versionVersion of Recorden_US
dc.relation.journalJournal of Physics: Condensed Matteren_US
dash.depositing.authorPershan, Peter S.
dash.embargo.until10000-01-01
dc.identifier.doi10.1088/0953-8984/6/23A/005*
dash.contributor.affiliatedPershan, Peter


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