X-Ray Reflectivity Study of the Surface of Liquid Gallium

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X-Ray Reflectivity Study of the Surface of Liquid Gallium

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Title: X-Ray Reflectivity Study of the Surface of Liquid Gallium
Author: Kawamoto, E. H.; Lee, S.; Pershan, Peter S.; Deutsch, M.; Maskil, N.; Ocko, B. M.

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Citation: Kawamoto, E. H., S. Lee, Peter S. Pershan, M. Deutsch, N. Maskil, and B. M. Ocko. 1993. X-ray reflectivity study of the surface of liquid gallium. Physical Review B 47(11): 6847-6850.
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Abstract: X-ray reflectivity from the surface of liquid gallium was measured under ultrahigh vacuum conditions using a novel technique for curved surfaces. The small deviations between the measured and theoretical Fresnel reflectivity for an ideally sharp flat interface for wave-vector transfer \(\lesssim\)0.5 Å\(^{-1}\) imply an interfacial width for the electron density profile of \(\lesssim\)1.3\(\pm\)0.2 Å. This is consistent with a model of atomic close packing which lacks structure along the surface normal at length scales >10 Å.
Published Version: doi:10.1103/PhysRevB.47.6847
Terms of Use: This article is made available under the terms and conditions applicable to Other Posted Material, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#LAA
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:10357542
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