Liquid-Vapor Density Profile of Helium: An X-Ray Study

DSpace/Manakin Repository

Liquid-Vapor Density Profile of Helium: An X-Ray Study

Citable link to this page


Title: Liquid-Vapor Density Profile of Helium: An X-Ray Study
Author: Lurio, L. B.; Rabedeau, T. A.; Pershan, Peter S.; Silvera, Isaac F.; Deutsch, M.; Kosowsky, S. D.; Ocko, B. M.

Note: Order does not necessarily reflect citation order of authors.

Citation: Lurio, L. B., T. A. Rabedeau, Peter S. Pershan, Isaac F. Silvera, M. Deutsch, S. D. Kosowsky, and B. M. Ocko. 1992. Liquid-vapor density profile of helium: An x-ray study. Physical Review Letters 68(17): 2628-2631.
Full Text & Related Files:
Abstract: The average liquid-vapor density profiles 〈ρ(z)〉 of thick \(^4\)He films adsorbed onto a silicon substrate were measured using x-ray reflectivity. The results are well represented by a 90%-10% interfacial width of 9.2\(\pm\)1 Å at 1.13 K which extrapolates to a T=0 K, 90%-10% interfacial width of 7.6\(\pm^{1}_{2}\) Å. The sensitivity of the measurement to the width, shape, and asymmetry of the density profile is discussed.
Published Version: doi:10.1103/PhysRevLett.68.2628
Other Sources:
Terms of Use: This article is made available under the terms and conditions applicable to Other Posted Material, as set forth at
Citable link to this page:
Downloads of this work:

Show full Dublin Core record

This item appears in the following Collection(s)


Search DASH

Advanced Search