Structural Relaxation of Amorphous \(Pd_{82}Si_{18}\): X-Ray Measurements, Electrical-Resistivity Measurements, and a Comparison Using the Ziman Theory

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Structural Relaxation of Amorphous \(Pd_{82}Si_{18}\): X-Ray Measurements, Electrical-Resistivity Measurements, and a Comparison Using the Ziman Theory

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Title: Structural Relaxation of Amorphous \(Pd_{82}Si_{18}\): X-Ray Measurements, Electrical-Resistivity Measurements, and a Comparison Using the Ziman Theory
Author: Chason, E.; Greer, A. L.; Kelton, K. F.; Pershan, Peter S.; Sorensen, L. B.; Spaepen, Frans A.; Weiss, A. H.

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Citation: Chason, E., A. L. Greer, K. F. Kelton, Peter S. Pershan, L. B. Sorensen, Frans A. Spaepen, and A. H. Weiss. 1985. Structural relaxation of amorphous \(Pd_{82}Si_{18}\): X-ray measurements, electrical-resistivity measurements, and a comparison using the Ziman theory. Physical Review B 32(6): 3399-3408.
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Abstract: Structural relaxation in amorphous \(Pd_{82}Si_{18}\) is studied using high-precision x-ray diffraction. The x-ray structure factor S(k) and the density ρ (determined from the x-ray absorption), are measured simultaneously as a function of the annealing conditions. The measured changes in S(k) are compared with those expected from simple densification using a Percus-Yevick model with two hard-sphere diameters. The variation in the electrical resistivity with annealing is also measured and is compared with the resistivity change estimated from the x-ray measurements using the Ziman theory. To allow a direct comparison of the x-ray and electrical measurements, we derive an approximate relationship between the x-ray atomic scattering factor and the pseudopotential as a substitute for a first-principles calculation. The combination of the low scattering rate from the amorphous samples and the high precision (<0.1%) necessary to allow direct comparison requires special techniques to maintain adequate system stability.
Published Version: doi:10.1103/PhysRevB.32.3399
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Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:10357691
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