Surface Roughness of Water Measured by X-Ray Reflectivity

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Surface Roughness of Water Measured by X-Ray Reflectivity

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Title: Surface Roughness of Water Measured by X-Ray Reflectivity
Author: Braslau, A.; Deutsch, M.; Pershan, Peter S.; Weiss, A. H.; Als-Nielsen, J.; Bohr, J.

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Citation: Braslau, A., M. Deutsch, Peter S. Pershan, A. H. Weiss, J. Als-Nielsen, and J. Bohr. 1985. Surface roughness of water measured by x-ray reflectivity. Physical Review Letters 54(2): 114-117.
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Abstract: The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation \((\lambda \sim1.5 \mathring{A})\), the angular dependence of the x-ray reflectivity was measured from grazing incidence \((\sim 0.0021 rad)\), where the reflectivity was greater than 0.96, to an incident angle of \(\sim 0.05 rad\), where the reflectivity was \(\sim 7×10^{-8}\). A fit to the data by a theory with only one adjustable parameter obtains \(3.2 \mathring{A}\) for the root-mean-square roughness of the water surface.
Published Version: doi:10.1103/PhysRevLett.54.114
Terms of Use: This article is made available under the terms and conditions applicable to Other Posted Material, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#LAA
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:10358893
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