# Surface Roughness of Water Measured by X-Ray Reflectivity

 Title: Surface Roughness of Water Measured by X-Ray Reflectivity Author: Braslau, A.; Deutsch, M.; Pershan, Peter S.; Weiss, A. H.; Als-Nielsen, J.; Bohr, J. Note: Order does not necessarily reflect citation order of authors. Citation: Braslau, A., M. Deutsch, Peter S. Pershan, A. H. Weiss, J. Als-Nielsen, and J. Bohr. 1985. Surface roughness of water measured by x-ray reflectivity. Physical Review Letters 54(2): 114-117. Full Text & Related Files: Braslau_Surface.pdf (631.5Kb; PDF) Abstract: The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation $$(\lambda \sim1.5 \mathring{A})$$, the angular dependence of the x-ray reflectivity was measured from grazing incidence $$(\sim 0.0021 rad)$$, where the reflectivity was greater than 0.96, to an incident angle of $$\sim 0.05 rad$$, where the reflectivity was $$\sim 7×10^{-8}$$. A fit to the data by a theory with only one adjustable parameter obtains $$3.2 \mathring{A}$$ for the root-mean-square roughness of the water surface. Published Version: doi:10.1103/PhysRevLett.54.114 Terms of Use: This article is made available under the terms and conditions applicable to Other Posted Material, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#LAA Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:10358893 Downloads of this work: