Surface Roughness of Water Measured by X-Ray Reflectivity
| Title: | Surface Roughness of Water Measured by X-Ray Reflectivity |
| Author: |
Braslau, A.; Deutsch, M.; Pershan, Peter S.; Weiss, A. H.; Als-Nielsen, J.; Bohr, J.
Note: Order does not necessarily reflect citation order of authors. |
| Citation: | Braslau, A., M. Deutsch, Peter S. Pershan, A. H. Weiss, J. Als-Nielsen, and J. Bohr. 1985. Surface roughness of water measured by x-ray reflectivity. Physical Review Letters 54(2): 114-117. |
| Full Text & Related Files: |
Braslau_Surface.pdf (631.5Kb; PDF) 
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| Abstract: | The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation \((\lambda \sim1.5 \mathring{A})\), the angular dependence of the x-ray reflectivity was measured from grazing incidence \((\sim 0.0021 rad)\), where the reflectivity was greater than 0.96, to an incident angle of \(\sim 0.05 rad\), where the reflectivity was \(\sim 7×10^{-8}\). A fit to the data by a theory with only one adjustable parameter obtains \(3.2 \mathring{A}\) for the root-mean-square roughness of the water surface. |
| Published Version: | doi:10.1103/PhysRevLett.54.114 |
| Terms of Use: | This article is made available under the terms and conditions applicable to Other Posted Material, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#LAA |
| Citable link to this page: | http://nrs.harvard.edu/urn-3:HUL.InstRepos:10358893 |
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