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dc.contributor.authorBraslau, A.
dc.contributor.authorDeutsch, M.
dc.contributor.authorPershan, Peter S.
dc.contributor.authorWeiss, A. H.
dc.contributor.authorAls-Nielsen, J.
dc.contributor.authorBohr, J.
dc.date.accessioned2013-03-01T20:09:37Z
dc.date.issued1985
dc.identifier.citationBraslau, A., M. Deutsch, Peter S. Pershan, A. H. Weiss, J. Als-Nielsen, and J. Bohr. 1985. Surface roughness of water measured by x-ray reflectivity. Physical Review Letters 54(2): 114-117.en_US
dc.identifier.issn0031-9007en_US
dc.identifier.issn1079-7114en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:10358893
dc.description.abstractThe roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation \((\lambda \sim1.5 \mathring{A})\), the angular dependence of the x-ray reflectivity was measured from grazing incidence \((\sim 0.0021 rad)\), where the reflectivity was greater than 0.96, to an incident angle of \(\sim 0.05 rad\), where the reflectivity was \(\sim 7×10^{-8}\). A fit to the data by a theory with only one adjustable parameter obtains \(3.2 \mathring{A}\) for the root-mean-square roughness of the water surface.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofdoi:10.1103/PhysRevLett.54.114en_US
dash.licenseLAA
dc.titleSurface Roughness of Water Measured by X-Ray Reflectivityen_US
dc.typeJournal Articleen_US
dc.description.versionVersion of Recorden_US
dc.relation.journalPhysical Review Lettersen_US
dash.depositing.authorPershan, Peter S.
dc.date.available2013-03-01T20:09:37Z
dc.identifier.doi10.1103/PhysRevLett.54.114*
dash.contributor.affiliatedPershan, Peter


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