Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films

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Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films

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Title: Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films
Author: Pershan, Peter S.; Sirota, Eric B.; Sorensen, L. B.; Collett, Jeffrey

Note: Order does not necessarily reflect citation order of authors.

Citation: Collett, Jeffrey, Peter S. Pershan, Eric B. Sirota, and L. B. Sorensen. 1984. Synchrotron x-ray study of the thickness dependence of the phase diagram of thin liquid-crystal films. Physical Review Letters 52(5): 356-359.
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Abstract: The phase diagram of freely suspended thin films of heptyloxybenzylidene-heptylaniline shows dramatic changes for thicknesses below 22 layers. The most surprising feature of the phase diagram is the inclusion of two phases lacking long-range crystalline order (smectic-F and hexatic-B phases) between two crystalline phases (crystalline smectic B and smectic G). Neither the smectic F nor the hexatic B occurs in bulk samples. Between sixteen and ten layers the width, in temperature, of the hexatic-B phase increases.
Published Version: doi:10.1103/PhysRevLett.52.356
Terms of Use: This article is made available under the terms and conditions applicable to Other Posted Material, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#LAA
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:10361602
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