dc.contributor.author | Collett, Jeffrey | |
dc.contributor.author | Pershan, Peter S. | |
dc.contributor.author | Sirota, Eric B. | |
dc.contributor.author | Sorensen, L. B. | |
dc.date.accessioned | 2013-03-01T20:35:30Z | |
dc.date.issued | 1984 | |
dc.identifier.citation | Collett, Jeffrey, Peter S. Pershan, Eric B. Sirota, and L. B. Sorensen. 1984. Synchrotron x-ray study of the thickness dependence of the phase diagram of thin liquid-crystal films. Physical Review Letters 52(5): 356-359. | en_US |
dc.identifier.issn | 0031-9007 | en_US |
dc.identifier.uri | http://nrs.harvard.edu/urn-3:HUL.InstRepos:10361602 | |
dc.description.abstract | The phase diagram of freely suspended thin films of heptyloxybenzylidene-heptylaniline shows dramatic changes for thicknesses below 22 layers. The most surprising feature of the phase diagram is the inclusion of two phases lacking long-range crystalline order (smectic-F and hexatic-B phases) between two crystalline phases (crystalline smectic B and smectic G). Neither the smectic F nor the hexatic B occurs in bulk samples. Between sixteen and ten layers the width, in temperature, of the hexatic-B phase increases. | en_US |
dc.description.sponsorship | Engineering and Applied Sciences | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | American Physical Society | en_US |
dc.relation.isversionof | doi:10.1103/PhysRevLett.52.356 | en_US |
dash.license | LAA | |
dc.title | Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films | en_US |
dc.type | Journal Article | en_US |
dc.description.version | Version of Record | en_US |
dc.relation.journal | Physical Review Letters | en_US |
dash.depositing.author | Pershan, Peter S. | |
dc.date.available | 2013-03-01T20:35:30Z | |
dc.identifier.doi | 10.1103/PhysRevLett.52.356 | * |
dash.contributor.affiliated | Pershan, Peter | |