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dc.contributor.authorAls-Nielsen, J.
dc.contributor.authorPershan, Peter S.
dc.date.accessioned2013-03-01T20:39:31Z
dc.date.issued1983
dc.identifier.citationAls-Nielsen, J., and Peter S. Pershan. 1983. Synchrotron X-ray diffraction study of liquid surfaces. Nuclear Instruments and Methods in Physics Research 208(1-3): 545-548.en_US
dc.identifier.issn0168-9002en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:10361603
dc.description.abstractA spectrometer for X-ray diffraction and refraction studies of horizontal, free surfaces of liquids is described. As an illustration smetic-A layering at the surface of a liquid crystal is presented.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherElsevieren_US
dc.relation.isversionofdoi:10.1016/0167-5087(83)91179-1en_US
dash.licenseMETA_ONLY
dc.titleSynchrotron X-Ray Diffraction Study of Liquid Surfacesen_US
dc.typeJournal Articleen_US
dc.description.versionVersion of Recorden_US
dc.relation.journalNuclear Instruments and Methods in Physics Researchen_US
dash.depositing.authorPershan, Peter S.
dash.embargo.until10000-01-01
dc.identifier.doi10.1016/0167-5087(83)91179-1*
dash.contributor.affiliatedPershan, Peter


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