dc.contributor.author | Als-Nielsen, J. | |
dc.contributor.author | Pershan, Peter S. | |
dc.date.accessioned | 2013-03-01T20:39:31Z | |
dc.date.issued | 1983 | |
dc.identifier.citation | Als-Nielsen, J., and Peter S. Pershan. 1983. Synchrotron X-ray diffraction study of liquid surfaces. Nuclear Instruments and Methods in Physics Research 208(1-3): 545-548. | en_US |
dc.identifier.issn | 0168-9002 | en_US |
dc.identifier.uri | http://nrs.harvard.edu/urn-3:HUL.InstRepos:10361603 | |
dc.description.abstract | A spectrometer for X-ray diffraction and refraction studies of horizontal, free surfaces of liquids is described. As an illustration smetic-A layering at the surface of a liquid crystal is presented. | en_US |
dc.description.sponsorship | Engineering and Applied Sciences | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | Elsevier | en_US |
dc.relation.isversionof | doi:10.1016/0167-5087(83)91179-1 | en_US |
dash.license | META_ONLY | |
dc.title | Synchrotron X-Ray Diffraction Study of Liquid Surfaces | en_US |
dc.type | Journal Article | en_US |
dc.description.version | Version of Record | en_US |
dc.relation.journal | Nuclear Instruments and Methods in Physics Research | en_US |
dash.depositing.author | Pershan, Peter S. | |
dash.embargo.until | 10000-01-01 | |
dc.identifier.doi | 10.1016/0167-5087(83)91179-1 | * |
dash.contributor.affiliated | Pershan, Peter | |