The Importance of Cantilever Dynamics in the Interpretation of Kelvin Probe Force Microscopy

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The Importance of Cantilever Dynamics in the Interpretation of Kelvin Probe Force Microscopy

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Title: The Importance of Cantilever Dynamics in the Interpretation of Kelvin Probe Force Microscopy
Author: Brown, Keith A.; Westervelt, Robert M.; Satzinger, Kevin J.

Note: Order does not necessarily reflect citation order of authors.

Citation: Satzinger, Kevin J., Keith A. Brown, and Robert M. Westervelt. 2012. The importance of cantilever dynamics in the interpretation of Kelvin probe force microscopy. Journal of Applied Physics 112(6): 64510.
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Abstract: A realistic interpretation of the measured contact potential difference (CPD) in Kelvin probe force microscopy (KPFM) is crucial in order to extract meaningful information about the sample. Central to this interpretation is a method to include contributions from the macroscopic cantilever arm, as well as the cone and sharp tip of a KPFM probe. Here, three models of the electrostatic interaction between a KPFM probe and a sample are tested through an electrostatic simulation and compared with experiment. In contrast with previous studies that treat the KPFM cantilever as a rigid object, we allow the cantilever to bend and rotate; accounting for cantilever bending provides the closest agreement between theory and experiment. We demonstrate that cantilever dynamics play a major role in CPD measurements and provide a simulation technique to explore this phenomenon.
Published Version: doi:10.1063/1.4754313
Other Sources: http://www.ncbi.nlm.nih.gov/pubmed/23093809
Terms of Use: This article is made available under the terms and conditions applicable to Open Access Policy Articles, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#OAP
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:10384889
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