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dc.contributor.authorXiao, Kechao
dc.contributor.authorGregoire, John M.
dc.contributor.authorMcCluskey, Patrick J.
dc.contributor.authorVlassak, Joost J.
dc.date.accessioned2013-06-07T15:42:36Z
dc.date.issued2012
dc.identifierQuick submit: 2013-04-28T12:54:09-04:00
dc.identifier.citationXiao, Kechao, John M. Gregoire, Patrick J. McCluskey, and Joost J. Vlassak. 2012. A scanning AC calorimetry technique for the analysis of nano-scale quantities of materials. Review of Scientific Instruments 83(11): 114901.en_US
dc.identifier.issn0034-6748en_US
dc.identifier.issn1089-7623en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:10728848
dc.description.abstractWe present a scanning AC nanocalorimetry method that enables calorimetry measurements at heating and cooling rates that vary from isothermal to \(2×10^3 K/s\), thus bridging the gap between traditional scanning calorimetry of bulk materials and nanocalorimetry. The method relies on a micromachined nanocalorimetry sensor with a serpentine heating element that is sensitive enough to make measurements on thin-film samples and composition libraries. The ability to perform calorimetry over such a broad range of scanning rates makes it an ideal tool to characterize the kinetics of phase transformations or to explore the behavior of materials far from equilibrium. We demonstrate the technique by performing measurements on thin-film samples of Sn, In, and Bi with thicknesses ranging from 100 to 300 nm. The experimental heat capacities and melting temperatures agree well with literature values. The measured heat capacities are insensitive to the applied AC frequency, scan rate, and heat loss to the environment over a broad range of experimental parameters.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.isversionofdoi:10.1063/1.4763571en_US
dc.relation.hasversionhttp://www.ncbi.nlm.nih.gov/pubmed/23206083en_US
dash.licenseOAP
dc.subjectbismuthen_US
dc.subjectcalorimetryen_US
dc.subjectindiumen_US
dc.subjectmeltingen_US
dc.subjectmicromachiningen_US
dc.subjectmicrosensorsen_US
dc.subjectspecific heaten_US
dc.subjecttinen_US
dc.titleA Scanning AC Calorimetry Technique for the Analysis of Nano-Scale Quantities of Materialsen_US
dc.typeJournal Articleen_US
dc.date.updated2013-04-28T16:54:16Z
dc.description.versionAccepted Manuscripten_US
dc.rights.holderKechao Xiao, John M. Gregoire, Patrick J. McCluskey, Joost J. Vlassak
dc.relation.journalReview of Scientific Instrumentsen_US
dash.depositing.authorVlassak, Joost J.
dc.date.available2013-06-07T15:42:36Z
dc.identifier.doi10.1063/1.4763571*
dash.contributor.affiliatedXiao, Kechao
dash.contributor.affiliatedVlassak, Joost


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