Dislocation Density-Dependent Quality Factors in InGaN Quantum Dot Containing Microdisks

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Dislocation Density-Dependent Quality Factors in InGaN Quantum Dot Containing Microdisks

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Title: Dislocation Density-Dependent Quality Factors in InGaN Quantum Dot Containing Microdisks
Author: El-Ella, H.A.R.; Kappers, M.J.; Oliver, R.A.; Rol, F; Hu, Evelyn; Russell, Kasey Joe

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Citation: El-Ella, H. A. R., F. Rol, M. J. Kappers, K. J. Russell, E. L. Hu, and R. A. Oliver. 2011. Dislocation density-dependent quality factors in InGaN quantum dot containing microdisks. Applied Physics Letters 98 (13): 131909.
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Abstract: Microdisks incorporating InGaN quantum dots were fabricated using SiO2 microspheres as a hard mask in conjunction with a photoelectrochemical etch step from a structure containing a sacrificial InGaN/InGaN superlattice. Formation of microdisks from two near-identical structures with differing dislocation densities was carried out and investigated using microphotoluminescence. This confirmed the existence of quantum dots through the presence of resolution limited spectral lines and showed a clear correlation between the resulting modes quality factors and the dislocation densities within the disks. The disks with higher dislocation densities showed up to 80% lower quality factors than the low dislocation density disks.
Published Version: doi:10.1063/1.3567545
Other Sources: http://people.seas.harvard.edu/~krussell/publications/El-Ella%20et%20al.%20-%202011%20-%20Dislocation%20density-dependent%20quality%20factors%20in%20I.pdf
Terms of Use: This article is made available under the terms and conditions applicable to Open Access Policy Articles, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#OAP
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:11006842
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