Instabilities in Multilayered Soft Dielectrics

DSpace/Manakin Repository

Instabilities in Multilayered Soft Dielectrics

Citable link to this page


Title: Instabilities in Multilayered Soft Dielectrics
Author: Bertoldi, Katia; Gei, Massimiliano

Note: Order does not necessarily reflect citation order of authors.

Citation: Bertoldi, Katia, and Massimiliano Gei. 2011. Instabilities in multilayered soft dielectrics. Journal of the Mechanics and Physics of Solids 59(1): 18-42.
Full Text & Related Files:
Abstract: Experimental observations clearly show that the performance of dielectric elastomeric-based devices can be considerably improved using composite materials. A critical issue in the development of composite dielectric materials toward applications is the prediction of their failure mechanisms due to the applied electromechanical loads. In this paper we investigate analytically the influence of electromechanical finite deformations on the stability of multilayered soft dielectrics under plane-strain conditions. Four different criteria are considered: (i) loss of positive definiteness of the tangent electroelastic constitutive operator, (ii) existence of diffuse modes of bifurcation (microscopic modes), (iii) loss of strong ellipticity of the homogenized continuum (localized or macroscopic modes), and (iv) electric breakdown. While the formulation is developed for generic isotropic hyperelastic dielectrics, results are presented for the special class of ideal dielectrics incorporating a neo-Hookean elastic response. The effect of material properties and loading conditions is investigated, providing a detailed picture of the different possible failure modes.
Published Version: doi:10.1016/j.jmps.2010.10.001
Terms of Use: This article is made available under the terms and conditions applicable to Open Access Policy Articles, as set forth at
Citable link to this page:
Downloads of this work:

Show full Dublin Core record

This item appears in the following Collection(s)


Search DASH

Advanced Search