Statistical screening for IC Trojan detection

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Statistical screening for IC Trojan detection

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Title: Statistical screening for IC Trojan detection
Author: Gwon, Youngjune Lee; Kung, H. T.; Vlah, Dario; Huang, Keng-Yen; Tsai, Yi-Min

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Citation: Gwon, Youngjune, H. T. Kung, Dario Vlah, Keng-Yen Huang, and Yi-Min Tsai. 2012. “Statistical screening for IC Trojan detection.” In 2012 IEEE International Symposium on Circuits and Systems, 85-88. Institute of Electrical and Electronics Engineers. doi:10.1109/ISCAS.2012.6272174. http://dx.doi.org/10.1109/ISCAS.2012.6272174.
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Abstract: We present statistical screening of test vectors for detecting a Trojan, malicious circuitry hidden inside an integrated circuit (IC). When applied a test vector, a Trojan-embedded chip draws extra leakage current that is unfortunately too small for the detector in most cases and concealed by process variation related to chip fabrication. To remedy the problem, we formulate a statistical approach that can screen and select test vectors in detecting Trojans. We validate our approach analytically and with gate-level simulations and show that our screening method leads to a substantial reduction in false positives and false negatives when detecting IC Trojans of various sizes.
Published Version: doi:10.1109/ISCAS.2012.6272174
Terms of Use: This article is made available under the terms and conditions applicable to Open Access Policy Articles, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#OAP
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:11688802
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