Statistical screening for IC Trojan detection

Abstract

We present statistical screening of test vectors for detecting a Trojan, malicious circuitry hidden inside an integrated circuit (IC). When applied a test vector, a Trojan-embedded chip draws extra leakage current that is unfortunately too small for the detector in most cases and concealed by process variation related to chip fabrication. To remedy the problem, we formulate a statistical approach that can screen and select test vectors in detecting Trojans. We validate our approach analytically and with gate-level simulations and show that our screening method leads to a substantial reduction in false positives and false negatives when detecting IC Trojans of various sizes.