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dc.contributor.advisorSuo, Zhigang
dc.contributor.advisorVlassak, Joost J.
dc.contributor.authorPharr, Matt Mathews
dc.date.accessioned2014-06-06T15:30:25Z
dc.date.issued2014-06-06
dc.date.submitted2014
dc.identifier.citationPharr, Matt Mathews. 2014. Diffusion, Deformation, and Damage in Lithium-Ion Batteries and Microelectronics. Doctoral dissertation, Harvard University.en_US
dc.identifier.otherhttp://dissertations.umi.com/gsas.harvard:11593en
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:12271804
dc.description.abstractThis thesis explores mechanical behavior of microelectronic devices and lithium-ion batteries. We first examine electromigration-induced void formation in solder bumps by constructing a theory that couples electromigration and creep. The theory can predict the critical current density below which voids do not form. Due to the effects of creep, this quantity is found to be independent of the solder size and decrease exponentially with increasing temperature, different from existing theories.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dash.licenseLAA
dc.subjectEngineeringen_US
dc.subjectMechanicsen_US
dc.subjectMaterials Scienceen_US
dc.subjectFractureen_US
dc.subjectKineticsen_US
dc.subjectLithium-ion batteriesen_US
dc.subjectMicroelectronicsen_US
dc.subjectPlasticityen_US
dc.subjectSoldersen_US
dc.titleDiffusion, Deformation, and Damage in Lithium-Ion Batteries and Microelectronicsen_US
dc.typeThesis or Dissertationen_US
dash.depositing.authorPharr, Matt Mathews
dc.date.available2014-06-06T15:30:25Z
thesis.degree.date2014en_US
thesis.degree.disciplineEngineering Sciencesen_US
thesis.degree.grantorHarvard Universityen_US
thesis.degree.leveldoctoralen_US
thesis.degree.namePh.D.en_US
dc.contributor.committeeMemberSuo, Zhigangen_US
dc.contributor.committeeMemberVlassak, Joosten_US
dc.contributor.committeeMemberRice, Jamesen_US
dc.contributor.committeeMemberRamanathan, Shriramen_US
dash.contributor.affiliatedPharr, Matt Mathews


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