Coaxial atomic force microscope probes for imaging with dielectrophoresis
MetadataShow full item record
CitationBrown, Keith A., Jesse Berezovsky, and R. M. Westervelt. 2011. “Coaxial Atomic Force Microscope Probes for Imaging with Dielectrophoresis.” Appl. Phys. Lett. 98 (18): 183103. doi:10.1063/1.3585670. http://dx.doi.org/10.1063/1.3585670.
AbstractWe demonstrate atomic force microscope(AFM) imaging using dielectrophoresis(DEP) with coaxial probes. DEP provides force contrast allowing coaxial probes to image with enhanced spatial resolution. We model a coaxial probe as an electric dipole to provide analytic formulas for DEP between a dipole, dielectric spheres, and a dielectric substrate. AFM images taken of dielectric spheres with and without an applied electric field show the disappearance of artifacts when imaging with DEP. Quantitative agreement between our model and experiment shows that we are imaging with DEP.
Citable link to this pagehttp://nrs.harvard.edu/urn-3:HUL.InstRepos:12585270
- FAS Scholarly Articles 
Contact administrator regarding this item (to report mistakes or request changes)