Coaxial atomic force microscope probes for imaging with dielectrophoresis

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Coaxial atomic force microscope probes for imaging with dielectrophoresis

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Title: Coaxial atomic force microscope probes for imaging with dielectrophoresis
Author: Brown, Keith; Berezovsky, Jesse; Westervelt, Robert M.

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Citation: Brown, Keith A., Jesse Berezovsky, and R. M. Westervelt. 2011. “Coaxial Atomic Force Microscope Probes for Imaging with Dielectrophoresis.” Appl. Phys. Lett. 98 (18): 183103. doi:10.1063/1.3585670. http://dx.doi.org/10.1063/1.3585670.
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Abstract: We demonstrate atomic force microscope(AFM) imaging using dielectrophoresis(DEP) with coaxial probes. DEP provides force contrast allowing coaxial probes to image with enhanced spatial resolution. We model a coaxial probe as an electric dipole to provide analytic formulas for DEP between a dipole, dielectric spheres, and a dielectric substrate. AFM images taken of dielectric spheres with and without an applied electric field show the disappearance of artifacts when imaging with DEP. Quantitative agreement between our model and experiment shows that we are imaging with DEP.
Published Version: doi:10.1063/1.3585670
Terms of Use: This article is made available under the terms and conditions applicable to Other Posted Material, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#LAA
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:12585270
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