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dc.contributor.authorBrown, Keith
dc.contributor.authorBerezovsky, Jesse
dc.contributor.authorWestervelt, Robert M.
dc.date.accessioned2014-07-28T20:05:13Z
dc.date.issued2011
dc.identifier.citationBrown, Keith A., Jesse Berezovsky, and R. M. Westervelt. 2011. “Coaxial Atomic Force Microscope Probes for Imaging with Dielectrophoresis.” Appl. Phys. Lett. 98 (18): 183103. doi:10.1063/1.3585670. http://dx.doi.org/10.1063/1.3585670.en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:12585270
dc.description.abstractWe demonstrate atomic force microscope(AFM) imaging using dielectrophoresis(DEP) with coaxial probes. DEP provides force contrast allowing coaxial probes to image with enhanced spatial resolution. We model a coaxial probe as an electric dipole to provide analytic formulas for DEP between a dipole, dielectric spheres, and a dielectric substrate. AFM images taken of dielectric spheres with and without an applied electric field show the disappearance of artifacts when imaging with DEP. Quantitative agreement between our model and experiment shows that we are imaging with DEP.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherAIP Publishingen_US
dc.relation.isversionofdoi:10.1063/1.3585670en_US
dash.licenseLAA
dc.titleCoaxial atomic force microscope probes for imaging with dielectrophoresisen_US
dc.typeJournal Articleen_US
dc.description.versionVersion of Recorden_US
dc.relation.journalApplied Physics Lettersen_US
dash.depositing.authorWestervelt, Robert M.
dc.date.available2014-07-28T20:05:13Z
dc.identifier.doi10.1063/1.3585670*
dash.contributor.affiliatedBrown, Keith Andrew
dash.contributor.affiliatedWestervelt, Robert


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