Browsing FAS Scholarly Articles by Keyword "Dielectrics"
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Impact of ultrathin Al[sub 2]O[sub 3] barrier layer on electrical properties of LaLuO[sub 3] metal-oxide-semiconductor devices
(AIP Publishing, 2011)Temperature-dependent current-voltage measurements showed Poole–Frenkel conduction behavior through high-κ LaLuO3 films made by atomic layer deposition on Si. The energy levels that trap electrons were around 0.66 eV below ...