Now showing items 1-2 of 2

• #### Re-entrant Appearance of Phases in a Relaxed Langmuir Monolayer of Tetracosanoic Acid as Determined by X-Ray Scattering ﻿

(American Institute of Physics, 1992)
The structure of the fully relaxed phases of a Langmuir monolayer of tetracosanoic acid is determined by x‐ray diffraction and reflection along an isotherm at ∼20.5 °C. Isotherms taken by allowing the surface pressure to ...
• #### X-Ray Grazing Incidence Diffraction from Alkylsiloxane Monolayers on Silicon Wafers ﻿

(American Institute of Physics, 1991)
X‐ray reflection (both specular and off‐specular) and grazing incidence diffraction (GID) have been used to study the structure of alkylsiloxane monolayers ($n‐C_{18}H_{37}SiO_{1.5}$) formed by self‐assembly from solution ...