Browsing FAS Scholarly Articles by Keyword "x-ray diffraction"
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Re-entrant Appearance of Phases in a Relaxed Langmuir Monolayer of Tetracosanoic Acid as Determined by X-Ray Scattering
(American Institute of Physics, 1992)The structure of the fully relaxed phases of a Langmuir monolayer of tetracosanoic acid is determined by x‐ray diffraction and reflection along an isotherm at ∼20.5 °C. Isotherms taken by allowing the surface pressure to ... -
X-Ray Grazing Incidence Diffraction from Alkylsiloxane Monolayers on Silicon Wafers
(American Institute of Physics, 1991)X‐ray reflection (both specular and off‐specular) and grazing incidence diffraction (GID) have been used to study the structure of alkylsiloxane monolayers (\(n‐C_{18}H_{37}SiO_{1.5}\)) formed by self‐assembly from solution ...